Scanning Electron Microscope (SEM)

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Falconmet operates three Hitachi Scanning Electron Microscopes. With magnification of up to 50,000X, these state of the art microscopes are used for failure analysis, forensic engineering, accident investigations, fracture examination and many other applications. A variety of detectors such as Secondary Electron, Back Scattered Electron, Channeling patterns, and others, enhance the capability of our microscopes. Many types of samples can be examined using SEM, such as metallic alloys, plastics, composites, glass, ceramics, etc.

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Energy Dispersive X-Ray Spectroscope

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Our Scanning Electron Microscopes are equipped with Energy Dispersive X-ray Spectroscope attachments. Used in conjunction with the Scanning Electron Microscope, the spectroscope can analyze the chemical composition of a given sample. Using our analysis software, we can provide qualitative or quantitative chemical composition and elemental maps.

 

X-Ray Spectroscopy is used in forensic laboratories where particles invisible to the naked eye are characterized. The nature of various fibers, particles and whiskers in air samples may also be determined, as well as the nature of the metallic residues found in the water, oil and hydraulic fluids.